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Hierarchically Distributed Fault Detection and Identification through Dempster–Shafer Evidence Fusion
Ghosh, Kaushik, Natarajan, Sathish, Srinivasan, RajagopalanVolume:
50
Language:
english
Journal:
Industrial & Engineering Chemistry Research
DOI:
10.1021/ie2003329
Date:
August, 2011
File:
PDF, 2.84 MB
english, 2011