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Reliability, Yield and Stress Burn-in: A Unified Approach for Microelectronics Systems Manufacturing and Software Development
Samaniego, Francisco J.Volume:
41
Language:
english
Journal:
Technometrics
DOI:
10.1080/00401706.1999.10485942
Date:
November, 1999
File:
PDF, 53 KB
english, 1999