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[IEEE 2014 IEEE 29th International Conference on Microelectronics (MIEL) - Belgrade, Serbia (2014.5.12-2014.5.14)] 2014 29th International Conference on Microelectronics Proceedings - MIEL 2014 - Interface structure characterization depending on the barrier film in TiAl-based metallizations to AlGaN/GaN heterostructures
Kolaklieva, L., Chandran, N., Kakanakov, R., Atanasova, G., Stefanov, P., Polychroniadis, E.Year:
2014
Language:
english
DOI:
10.1109/miel.2014.6842154
File:
PDF, 347 KB
english, 2014