Atomic XAFS as a Tool to Probe the Electronic Properties of...

Journal of the American Chemical Society 2005 / 03 Vol. 127; Iss. 10

Atomic XAFS as a Tool to Probe the Electronic Properties of Supported Noble Metal Nanoclusters

van der Eerden, Ad M. J., Visser, Tom, Nijhuis, T. Alexander, Ikeda, Yasuo, Lepage, Muriel, Koningsberger, Diek C., Weckhuysen, Bert M.
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Volume:
127
Language:
english
Journal:
Journal of the American Chemical Society
DOI:
10.1021/ja043107l
Date:
March, 2005
File:
PDF, 49 KB
english, 2005
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