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[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Design and evaluation of fine-grained power-gating for embedded microprocessors
Kondo, Masaaki, Kobyashi, Hiroaki, Sakamoto, Ryuichi, Wada, Motoki, Tsukamoto, Jun, Namiki, Mitaro, Wang, Weihan, Amano, Hideharu, Matsunaga, Kensaku, Kudo, Masaru, Usami, Kimiyoshi, Komoda, Toshiya,Year:
2014
Language:
english
DOI:
10.7873/date.2014.158
File:
PDF, 460 KB
english, 2014