Scanning Microfocus Small-Angle X-ray Scattering: A New Tool To Investigate Defects at Polymer−Polymer Interfaces
Lorenz-Haas, C., Müller-Buschbaum, P., Wunnicke, O., Cassignol, C., Burghammer, M., Riekel, C., Stamm, M.Volume:
19
Language:
english
Journal:
Langmuir
DOI:
10.1021/la026693+
Date:
April, 2003
File:
PDF, 115 KB
english, 2003