[Inst. Electr. Eng. Japan 13th International Symposium on Power Semiconductor Devices & ICs. IPSD '01 - Osaka, Japan (4-7 June 2001)] Proceedings of the 13th International Symposium on Power Semiconductor Devices & ICs. IPSD '01 (IEEE Cat. No.01CH37216) - Fine pattern effect on leakage current and reverse recovery characteristics of MPS diode
Naito, T., Nemoto, M., Nishiura, A., Otsuki, M., Kirisawa, M., Seki, Y.Year:
2001
Language:
english
DOI:
10.1109/ispsd.2001.934596
File:
PDF, 333 KB
english, 2001