Microstructural Analysis of Void Formation Due to a NH 4 Cl Layer for Self-Separation of GaN Thick Films
Lee, Hyun-Jae, Ha, Jun-Seok, Yao, Takafumi, Kim, Chinkyo, Hong, Soon-Ku, Chang, Jiho, Lee, Jae Wook, Lee, Jeong YongVolume:
9
Language:
english
Journal:
Crystal Growth & Design
DOI:
10.1021/cg900193k
Date:
June, 2009
File:
PDF, 2.32 MB
english, 2009