Atomic Force Microscopy Can Detect the Binding of Yeast...

Nano Letters 2003 / 01 Vol. 3; Iss. 1

Atomic Force Microscopy Can Detect the Binding of Yeast Replication Factor C to DNA

Green, Lisa, Schotanus, Mark, McAlear, Michael A., Howell, Elizabeth A.
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Volume:
3
Language:
english
Journal:
Nano Letters
DOI:
10.1021/nl025831c
Date:
January, 2003
File:
PDF, 86 KB
english, 2003
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