Thermal diffusivity measurements of semiconducting amorphous GexSe100−x thin films by photothermal deflection technique
Alex Mathew, Jyotsna Ravi, K.N. Madhusoodanan, K.P.R. Nair, T.M.A. RasheedVolume:
227
Year:
2004
Language:
english
Pages:
6
DOI:
10.1016/j.apsusc.2003.12.020
File:
PDF, 109 KB
english, 2004