Structural characterization of ultrathin Cr and Sc films...

Structural characterization of ultrathin Cr and Sc films for soft X-ray mirrors

Tatiana Gorelik, Ute Kaiser, Thomas Kuhlmann, Sergey Yulin, Wolfgang Richter
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Volume:
230
Year:
2004
Language:
english
Pages:
7
DOI:
10.1016/j.apsusc.2004.02.006
File:
PDF, 526 KB
english, 2004
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