ToF-SIMS molecular characterization and nano-SIMS imaging of submicron domain formation at the surface of PS/PMMA blend and copolymer thin films
L. Kailas, J.-N. Audinot, H.-N. Migeon, P. BertrandVolume:
231-232
Year:
2004
Language:
english
Pages:
7
DOI:
10.1016/j.apsusc.2004.03.063
File:
PDF, 446 KB
english, 2004