ToF-SIMS depth profiling of alumina scales formed on a FeCrAl high-temperature alloy
J. Engkvist, U. Bexell, T.M. Grehk, M. OlssonVolume:
231-232
Year:
2004
Language:
english
Pages:
4
DOI:
10.1016/j.apsusc.2004.03.141
File:
PDF, 116 KB
english, 2004