Characterization of nickel phosphorus surface by ToF-SIMS

Applied Surface Science 2004 Vol. 231-232; Iss. none

Characterization of nickel phosphorus surface by ToF-SIMS

Bin C. Zhang, Gunter Barth, Hui Kathy Liu, Susan Chang
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Volume:
231-232
Year:
2004
Language:
english
Pages:
6
DOI:
10.1016/j.apsusc.2004.03.153
File:
PDF, 168 KB
english, 2004
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