Surface potential mapping of biased pn junction with kelvin...

Applied Surface Science 2004 Vol. 235; Iss. 4

Surface potential mapping of biased pn junction with kelvin probe force microscopy: application to cross-section devices

A. Doukkali, S. Ledain, C. Guasch, J. Bonnet
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Volume:
235
Year:
2004
Language:
english
Pages:
6
DOI:
10.1016/j.apsusc.2004.03.249
File:
PDF, 232 KB
english, 2004
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