Annealing and measurement temperature dependence of...

Applied Surface Science 2006 Vol. 252; Iss. 16

Annealing and measurement temperature dependence of W2B5-based rectifying contacts to n-GaN

Rohit Khanna, S.J. Pearton, F. Ren, I. Kravchenko
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Volume:
252
Year:
2006
Language:
english
Pages:
6
DOI:
10.1016/j.apsusc.2005.07.036
File:
PDF, 366 KB
english, 2006
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