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Temperature dependent low energy electron microscopy study of Ge growth on Si(1 1 3)
T. Clausen, Th. Schmidt, J.I. Flege, A. Locatelli, T.O. Mentes, S. Heun, F.Z. Guo, J. FaltaVolume:
252
Year:
2006
Language:
english
Pages:
5
DOI:
10.1016/j.apsusc.2005.12.021
File:
PDF, 381 KB
english, 2006