ToF-SIMS depth profiling of (Ga,Mn)As capped with amorphous arsenic: Effects of annealing time
U. Bexell, V. Stanciu, P. Warnicke, M. Östh, P. SvedlindhVolume:
252
Year:
2006
Language:
english
Pages:
3
DOI:
10.1016/j.apsusc.2006.02.167
File:
PDF, 117 KB
english, 2006