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Static secondary ion mass spectrometry (S-SIMS) analysis of atmospheric plasma treated polypropylene films
Bart Boschmans, Myriam Vanneste, Luc Ruys, Eef Temmerman, Christophe Leys, Luc Van VaeckVolume:
252
Year:
2006
Language:
english
Pages:
4
DOI:
10.1016/j.apsusc.2006.02.240
File:
PDF, 282 KB
english, 2006