Secondary ion statistics and determination of nanocluster...

Applied Surface Science 2006 Vol. 252; Iss. 19

Secondary ion statistics and determination of nanocluster (m > 107 amu) ion registration efficiency

A.V. Novikov, S.N. Kirillov, I.A. Baranov, V.V. Obnorskii, S.V. Yarmiychuk
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Volume:
252
Year:
2006
Language:
english
Pages:
4
DOI:
10.1016/j.apsusc.2006.02.268
File:
PDF, 227 KB
english, 2006
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