Surface roughening and erosion rate change at low energy...

Surface roughening and erosion rate change at low energy SIMS depth profiling of silicon during oblique bombardment

B. Fares, B. Gautier, Ph. Holliger, N. Baboux, G. Prudon, J.-Cl. Dupuy
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Volume:
253
Year:
2006
Language:
english
Pages:
9
DOI:
10.1016/j.apsusc.2006.05.034
File:
PDF, 679 KB
english, 2006
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