Recent advances in high-resolution X-ray diffractometry applied to nanostructured oxide thin films: The case of yttria stabilized zirconia epitaxially grown on sapphire
A. Boulle, R. Guinebretière, O. Masson, R. Bachelet, F. Conchon, A. DaugerVolume:
253
Year:
2006
Language:
english
Pages:
11
DOI:
10.1016/j.apsusc.2006.05.086
File:
PDF, 983 KB
english, 2006