Characterization of Si nanocrystals into SiO2 matrix

Characterization of Si nanocrystals into SiO2 matrix

C. Gravalidis, S. Logothetidis, N. Hatziaras, A. Laskarakis, I. Tsiaoussis, N. Frangis
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Volume:
253
Year:
2006
Language:
english
Pages:
4
DOI:
10.1016/j.apsusc.2006.06.019
File:
PDF, 751 KB
english, 2006
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