Microstructure and electrical characterization based on AFM...

Microstructure and electrical characterization based on AFM of very high-doped polysilicon grains

R. Coq Germanicus, E. Picard, B. Domenges, K. Danilo, R. Rogel
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
253
Year:
2007
Language:
english
Pages:
7
DOI:
10.1016/j.apsusc.2006.12.114
File:
PDF, 945 KB
english, 2007
Conversion to is in progress
Conversion to is failed