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SIMS as a subnanometer probe: A new tool for chemical profile analysis of grafted molecules
Frédéric Chérioux, Bernard Gauthier-Manuel, John Eccles, Thierry Grenut, Marc BriantVolume:
253
Year:
2007
Language:
english
Pages:
4
DOI:
10.1016/j.apsusc.2007.01.017
File:
PDF, 433 KB
english, 2007