Slow positron beam study of nitrogen implanted CZ-Si...

Slow positron beam study of nitrogen implanted CZ-Si subjected to rapid thermal processing

X.P. Hao, R.S. Yu, B.Y. Wang, H.L. Chen, D.N. Wang, C.X. Ma, L. Wei
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Volume:
253
Year:
2007
Language:
english
Pages:
4
DOI:
10.1016/j.apsusc.2007.01.125
File:
PDF, 382 KB
english, 2007
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