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In situ topographical imaging of electrode surfaces using high-resolution phase-measurement interferometric microscopy
White, Henry S., Earl, David J., Norton, John D., Kragt, Harlan J.Volume:
62
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac00210a007
Date:
June, 1990
File:
PDF, 651 KB
english, 1990