[IEEE 2011 IEEE Custom Integrated Circuits Conference - CICC 2011 - San Jose, CA, USA (2011.09.19-2011.09.21)] 2011 IEEE Custom Integrated Circuits Conference (CICC) - 28nm metal-gate high-K CMOS SoC technology for high-performance mobile applications
Yang, S.H., Sheu, J.Y., Ieong, M.K., Chiang, M.H., Yamamoto, T., Liaw, J.J., Chang, S.S., Lin, Y.M., Hsu, T.L., Hwang, J.R., Ting, J.K., Wu, C.H., Ting, K.C., Yang, F.C., Liu, C.M., Wu, I.L., Chen, Y.Year:
2011
Language:
english
DOI:
10.1109/cicc.2011.6055355
File:
PDF, 766 KB
english, 2011