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Surface flatness of optical thin films evaluated by gray level co-occurrence matrix and entropy
Chuen-Lin Tien, You-Ru Lyu, Shiao-Shan JyuVolume:
254
Year:
2008
Language:
english
Pages:
6
DOI:
10.1016/j.apsusc.2008.01.088
File:
PDF, 1.01 MB
english, 2008