Surface depth analysis for fluorinated block copolymer films by X-ray photoelectron spectroscopy using C60 cluster ion beam
Keiji Tanaka, Noriaki Sanada, Masaya Hikita, Tetsuya Nakamura, Tisato Kajiyama, Atsushi TakaharaVolume:
254
Year:
2008
Language:
english
Pages:
4
DOI:
10.1016/j.apsusc.2008.02.089
File:
PDF, 339 KB
english, 2008