Study of buried...

Applied Surface Science 2008 Vol. 254; Iss. 23

Study of buried Si(1 1 1)-5 × 2-Au by surface X-ray diffraction

Yusaku Iwasawa, Wolfgang Voegeli, Tetsuroh Shirasawa, Kouji Sekiguchi, Takehiro Nojima, Ryuji Yoshida, Toshio Takahashi, Masuaki Matsumoto, Tatsuo Okano, Koichi Akimoto, Hiroshi Kawata, Hiroshi Sugiya
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Volume:
254
Year:
2008
Language:
english
Pages:
4
DOI:
10.1016/j.apsusc.2008.02.129
File:
PDF, 458 KB
english, 2008
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