[IEEE European Test Symposium (ETS'05) - Tallinn, Estonia (22-25 May 2005)] European Test Symposium (ETS'05) - Test Control for Secure Scan Designs
Hely, D., Bancel, F., Flottes, M., Rouzeyre, B.Year:
2005
Language:
english
DOI:
10.1109/ets.2005.36
File:
PDF, 117 KB
english, 2005