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Defect study in ZnO related structures—A multi-spectroscopic approach
C.C. Ling, C.K. Cheung, Q.L. Gu, X.M. Dai, S.J. Xu, C.Y. Zhu, J.M. Luo, C.Y. Zhu, K.H. Tam, A.B. Djurišić, C.D. Beling, S. Fung, L.W. Lu, G. Brauer, W. Anwand, W. Skorupa, H.C. OngVolume:
255
Year:
2008
Language:
english
Pages:
5
DOI:
10.1016/j.apsusc.2008.05.309
File:
PDF, 526 KB
english, 2008