Controlled variation of the information depth by angle...

Applied Surface Science 2008 Vol. 255; Iss. 5-part-P1

Controlled variation of the information depth by angle dependent soft X-ray emission spectroscopy: A study on polycrystalline Cu(In,Ga)Se2

H. Mönig, I. Lauermann, A. Grimm, C. Camus, C.A. Kaufmann, P. Pistor, Ch. Jung, T. Kropp, M.C. Lux-Steiner, Ch.-H. Fischer
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Volume:
255
Year:
2008
Language:
english
Pages:
4
DOI:
10.1016/j.apsusc.2008.07.177
File:
PDF, 557 KB
english, 2008
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