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Internal photoemission study on charge trapping behavior in rapid thermal oxides on strained-Si/SiGe heterolayers
M.K. Bera, C. Mahata, S. Bhattacharya, A.K. Chakraborty, B.M. Armstrong, H.S. Gamble, C.K. MaitiVolume:
255
Year:
2008
Language:
english
Pages:
7
DOI:
10.1016/j.apsusc.2008.08.087
File:
PDF, 1.16 MB
english, 2008