Charge trapping and detrapping characteristics in amorphous...

Semiconductor Science and Technology 2009 / 01 Vol. 24; Iss. 1

Charge trapping and detrapping characteristics in amorphous InGaZnO TFTs under static and dynamic stresses

Cho, In-Tak, Lee, Jeong-Min, Lee, Jong-Ho, Kwon, Hyuck-In
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Volume:
24
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/24/1/015013
Date:
January, 2009
File:
PDF, 165 KB
english, 2009
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