Analysis of intensities of positive and negative ion...

Analysis of intensities of positive and negative ion species from silicon dioxide films using time-of-flight secondary ion mass spectrometry and electronegativity of fragments

Kiyoshi Chiba
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
256
Year:
2010
Language:
english
Pages:
6
DOI:
10.1016/j.apsusc.2009.09.085
File:
PDF, 555 KB
english, 2010
Conversion to is in progress
Conversion to is failed