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[IEEE 2013 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with NSREC 2013) - San Francisco, CA, USA (2013.07.8-2013.07.12)] 2013 IEEE Radiation Effects Data Workshop (REDW) - Radiation Effects of High Voltage MESFETs at the 45nm Node
Wilk, Seth J., Lepkowski, William, Chen, Bo, Kam, Jason, Goryll, Michael, Holbert, Keith, Thornton, Trevor J.Year:
2013
Language:
english
DOI:
10.1109/redw.2013.6658202
File:
PDF, 269 KB
english, 2013