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[IEEE 2014 IEEE 32nd VLSI Test Symposium (VTS) - Napa, CA, USA (2014.04.13-2014.04.17)] 2014 IEEE 32nd VLSI Test Symposium (VTS) - A built-in self-test technique for load inductance and lossless current sensing of DC-DC converters
Liu, Tao, Fu, Chao, Ozev, Sule, Bakkaloglu, BertanYear:
2014
Language:
english
DOI:
10.1109/vts.2014.6818750
File:
PDF, 946 KB
english, 2014