Tunnel FETs for Ultra-Low Voltage Digital VLSI Circuits: Part II–Evaluation at Circuit Level and Design Perspectives
Alioto, Massimo, Esseni, DavidVolume:
22
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2013.2293153
Date:
December, 2014
File:
PDF, 4.48 MB
english, 2014