[IEEE 2008 IEEE International Power Electronics Congress - CIEP - Cuernavaca (2008.08.24-2008.08.27)] 2008 11th IEEE International Power Electronics Congress - 4H-SiC PiN diode electrothermal model for conduction and reverse breakdown for simulator
Hernandez, L., Claudio-Sanchez, A., Cotorogea, M., Aguayo, J., Rodriuez, M. A.Year:
2008
Language:
english
DOI:
10.1109/ciep.2008.4653842
File:
PDF, 402 KB
english, 2008