Measurement of the interior structure of thin polymer films using grazing incidence diffuse x-ray scattering
Mukhopadhyay, M. K., Lurio, L. B., Jiang, Z., Jiao, X., Sprung, Michael, DeCaro, Curt, Sinha, S. K.Volume:
82
Language:
english
Journal:
Physical Review E
DOI:
10.1103/physreve.82.011804
Date:
July, 2010
File:
PDF, 418 KB
english, 2010