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Low-frequency noise in AlN/AlGaN/GaN metal-insulator-semiconductor devices: A comparison with Schottky devices
Le, Son Phuong, Nguyen, Tuan Quy, Shih, Hong-An, Kudo, Masahiro, Suzuki, Toshi-kazuVolume:
116
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4892486
Date:
August, 2014
File:
PDF, 2.96 MB
english, 2014