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[IEEE IMTC/99. 16th IEEE Instrumentation and Measurement Technology Conference. Measurements for the New Millennium - Venice, Italy (24-26 May 1999)] IMTC/99. Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference (Cat. No.99CH36309) - Aperture jitter effects in wideband sampling systems
Kobayashi, H., Morimura, M., Kobayashi, K., Onaya, Y.Volume:
2
Year:
1999
Language:
english
DOI:
10.1109/imtc.1999.776991
File:
PDF, 431 KB
english, 1999