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High-Throughput Screening of Si–Ni Flux for SiC Solution Growth Using a High-Temperature Laser Microscope Observation and Secondary Ion Mass Spectroscopy Depth Profiling
Maruyama, Shingo, Onuma, Aomi, Kurashige, Kazuhisa, Kato, Tomohisa, Okumura, Hajime, Matsumoto, YujiVolume:
15
Language:
english
Journal:
ACS Combinatorial Science
DOI:
10.1021/co400009z
Date:
June, 2013
File:
PDF, 3.74 MB
english, 2013