Erbium Doped SiO 2 Layers...

Chemistry of Materials 1997 / 12 Vol. 9; Iss. 12

Erbium Doped SiO 2 Layers Formed on the Surface of Silicon by Spark Processing

St. John, John V., Coffer, Jeffery L., Rho, Young G., Diehl, Patrick, Pinizzotto, Russell F., Culp, Thomas D., Bray, Kevin L.
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Volume:
9
Language:
english
Journal:
Chemistry of Materials
DOI:
10.1021/cm970477i
Date:
December, 1997
File:
PDF, 267 KB
english, 1997
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