Metal-Assisted Secondary Ion Mass Spectrometry:  Influence...

Analytical Chemistry 2004 / 11 Vol. 76; Iss. 22

Metal-Assisted Secondary Ion Mass Spectrometry:  Influence of Ag and Au Deposition on Molecular Ion Yields

Adriaensen, L., Vangaever, F., Gijbels, R.
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Volume:
76
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac049108d
Date:
November, 2004
File:
PDF, 773 KB
english, 2004
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