Defect Interactions of ${\hbox{H}}_{2}$ in...

IEEE Transactions on Nuclear Science 2010 / 12

Defect Interactions of ${\hbox{H}}_{2}$ in ${\hbox{SiO}}_{2}$: Implications for ELDRS and Latent Interface Trap Buildup

Tuttle, Blair R., Hughart, David R., Schrimpf, Ronald D., Fleetwood, Daniel M., Pantelides, Sokrates T.
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Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2010.2086076
Date:
December, 2010
File:
PDF, 865 KB
english, 2010
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