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[IEEE 2010 International Conference on Microelectronics (ICM) - Cairo, Egypt (2010.12.19-2010.12.22)] 2010 International Conference on Microelectronics - Design of a robust, high performance standard cell threshold logic family for DSM technology

Leshner, Samuel, Kulkarni, Niranjan, Vrudhula, Sarma, Berezowski, Krzysztof
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Year:
2010
Language:
english
DOI:
10.1109/icm.2010.5696203
File:
PDF, 205 KB
english, 2010
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