[IEEE 2010 International Conference on Microelectronics (ICM) - Cairo, Egypt (2010.12.19-2010.12.22)] 2010 International Conference on Microelectronics - Design of a robust, high performance standard cell threshold logic family for DSM technology
Leshner, Samuel, Kulkarni, Niranjan, Vrudhula, Sarma, Berezowski, KrzysztofYear:
2010
Language:
english
DOI:
10.1109/icm.2010.5696203
File:
PDF, 205 KB
english, 2010