[IEEE 2012 International Conference on Advanced...

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[IEEE 2012 International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM) - Smolenice, Slovakia (2012.11.11-2012.11.15)] The Ninth International Conference on Advanced Semiconductor Devices and Mircosystems - Influence of active volume on detection efficiency of GaAs neutron detectors

Sagatova, A., Zafko, B., Sedlackova, K, Dubecky, F., Bohacek, P., Necas, V.
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Year:
2012
Language:
english
DOI:
10.1109/asdam.2012.6418581
File:
PDF, 710 KB
english, 2012
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